Atomic force microscopy calibration methods for lateral force, elasticity, and viscosity

Materials Research Society Symposium - Proceedings

Volumn 522, Issue , 1998, Pages 187-192

  Buenviaje, C K ^a   Ge, S R ^a   Rafailovich, M H ^a   Overney, R M ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTICITY; FRICTION; KINEMATICS; VISCOELASTICITY;

BLIND CALIBRATION METHOD; ELASTIC CONSTANT;

MATERIALS SCIENCE;

EID: 0032306721     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)