Distributed BIST technique for diagnosis of MCM interconnections

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 214-221

  Pendurkar, Rajesh ^a   Chatterjee, Abhijit ^a   Zorian, Yervant ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RECONFIGURABLE SIGNATURE ANALYZERS; TEST PATTERN GENERATORS;

BUILT-IN SELF TEST; CASCADE CONNECTIONS; COMPUTER SIMULATION; ELECTRIC CONTACTS; EMBEDDED SYSTEMS; MULTICHIP MODULES;

INTEGRATED CIRCUIT TESTING;

EID: 0032306405     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743154     Document Type: Conference Paper

References (20)