Spectral analysis of leakage current on contaminated insulators by Auto Regressive method

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 1, Issue , 1998, Pages 64-66

  Sato, M ^a   Nakajima, A ^a   Komukai, T ^a   Oyamada, T ^a  

^a AKITA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; LEAKAGE CURRENTS; REGRESSION ANALYSIS; SPECTRUM ANALYSIS; WAVEFORM ANALYSIS;

AUTOREGRESSION (AR) ANALYSIS; SALT-FOG DENSITY;

ELECTRIC INSULATING MATERIALS;

EID: 0032306129     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)