Stuck-at fault: A fault model for the next millennium

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 1166-

  Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CRYSTAL DEFECTS; LOGIC GATES;

STUCK-AT FAULT MODELS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0032306088     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)