Shared I/O-cell structures: A framework for extending the IEEE 1149.1 Boundary-Scan Standard

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 980-989

  Dervisoglu, Bulent ^a   Ricchetti, Mike ^a   Eklow, Bill ^a  

^a SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; STANDARDS;

BOUNDARY-SCAN STANDARDS;

DESIGN FOR TESTABILITY;

EID: 0032306085     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)