Detecting resistive shorts for CMOS domino circuits

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 890-899

  Chang, Jonathan T Y ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOMINO CIRCUITS;

ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; INTEGRATED CIRCUIT TESTING; LOGIC GATES; SHORT CIRCUIT CURRENTS;

CMOS INTEGRATED CIRCUITS;

EID: 0032306084     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743280     Document Type: Conference Paper

References (21)