Testing the design: The evolution of test simulation

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 612-621

  Force, Craig ^a   Austin, Tom ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER AIDED ENGINEERING; COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE;

TEST SIMULATION;

INTEGRATED CIRCUIT TESTING;

EID: 0032305910     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)