Designing for scan test of high performance embedded memories

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 101-108

  Vida Torku, E Kofi ^a   Joos, George ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; DATA STORAGE EQUIPMENT; EMBEDDED SYSTEMS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS;

HIGH PERFORMANCE EMBEDDED MEMORIES;

INTEGRATED CIRCUIT TESTING;

EID: 0032305751     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)