New diffractometer for high energy synchrotron radiation at the elliptical multipole wiggler at the APS

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3448, Issue , 1998, Pages 132-142

  Rutt, U ^a   Schneider, J R ^a   Beno, M A ^a   Knapp, G S ^a   Montano, P A ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTROMAGNETIC WAVE SCATTERING; ELECTROMAGNETIC WAVE TRANSMISSION; MONOCHROMATORS; OPTICAL RESOLVING POWER; PHOTONS; SEMICONDUCTING SILICON; SYNCHROTRON RADIATION;

ADVANCED PHOTON SOURCES (APS); ELLIPTICAL MULTIPOLE WIGGLER BEAMLINES;

DIFFRACTOMETERS;

EID: 0032305129     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (36)