UHV experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy

Electron Technology (Warsaw)

Volumn 31, Issue 3-4, 1998, Pages 502-504

  Grzadziel, L ^a   Szuber, J ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; ELECTRIC SPACE CHARGE; ELECTRONIC PROPERTIES; ORGANOMETALLICS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; THIN FILMS;

PHOTOEMISSION YIELD SPECTROSCOPY (PYS); PHTHALOCYANINE THIN FILMS;

METALLIC FILMS;

EID: 0032304902     PISSN: 00709816     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)