Stress grading materials: A discussion on lumped elements circuits validity

IEEE International Conference on Conduction & Breakdown in Solid Dielectrics

Volumn , Issue , 1998, Pages 524-527

  Rivenc, Jean P ^a   Bidan, Pierre ^a   Lebey, Thierry ^a  

^a d'Hydraulique et des Telecommunications   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC FIELDS; ELECTRIC POTENTIAL; MATHEMATICAL MODELS; MAXWELL EQUATIONS; PERMITTIVITY; VARNISH;

LUMPED ELEMENT CIRCUITS; STRESS GRADING MATERIALS;

ELECTRIC INSULATING COATINGS;

EID: 0032304818     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)