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Volumn 1, Issue , 1998, Pages 274-277
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Investigation of arc roots of constricted high current vacuum arcs
a a
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SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT DENSITY;
ELECTRIC ARCS;
ELECTRIC CURRENT MEASUREMENT;
HIGH CURRENT VACUUM ARCS;
ELECTRON TUBES;
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EID: 0032304646
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (8)
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