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Volumn 37, Issue 12 PART A, 1998, Pages
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Improved stability of metal-insulator-diamond semiconductor interface by employing BaF2 insulator film
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Author keywords
BaF2; C V curve; CaF2; Diamond; MgF2; MIS; Surface state
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Indexed keywords
BAND STRUCTURE;
BARIUM COMPOUNDS;
CALCIUM COMPOUNDS;
CAPACITANCE;
ELECTRIC INSULATING MATERIALS;
ELECTRIC POTENTIAL;
ELECTRONIC DENSITY OF STATES;
FLUORINE COMPOUNDS;
GATES (TRANSISTOR);
INTERFACES (MATERIALS);
MAGNESIUM COMPOUNDS;
SEMICONDUCTING DIAMONDS;
BARIUM FLUORIDE;
CALCIUM FLUORIDE;
CAPACITANCE VOLTAGE CHARACTERISTICS;
MAGNESIUM FLUORIDE;
MISFET DEVICES;
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EID: 0032304480
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.37.l1444 Document Type: Article |
Times cited : (10)
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References (13)
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