Fast scanning spectroscopic method for the submillimeter: The FASSST spectrometer

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3465, Issue , 1998, Pages 236-246

  De Lucia, Frank C ^a   Albert, Sieghard ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DOPPLER EFFECT; MICROWAVE OSCILLATORS; MILLIMETER WAVES; TUNING;

BACKWARD WAVE OSCILLATORS (BWO); FAST SCAN SUBMILLIMETER SPECTROSCOPIC TECHNIQUE (FASSST);

MICROWAVE SPECTROMETERS;

EID: 0032303674     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.331170     Document Type: Conference Paper

References (19)