First MPQ IRFPA results using LCR/SOFRADIR technologies

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3436, Issue 1, 1998, Pages 257-269

  Vuillermet, Michel ^a   Minassian, Christophe ^a   Pitault, Bernard ^a   Bois, Philippe ^a   Costard, Eric ^a   Nagle, Julien ^a  

^a SOFRADIR   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; HIGH TEMPERATURE OPERATIONS; READOUT SYSTEMS; SEMICONDUCTOR QUANTUM WELLS;

INFRARED FOCAL PLANE ARRAYS (IRFPA); QUANTUM WELL INFRARED PHOTODETECTORS (QWIP); READOUT INTEGRATED CIRCUITS (ROIC);

INFRARED DETECTORS;

EID: 0032303649     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.328022     Document Type: Conference Paper

References (2)