Low Temperature Thermometry in High Magnetic Fields

Journal of Low Temperature Physics

Volumn 113, Issue 5-6, 1998, Pages 963-968

  Ihas, Gary G ^a   Frederick, L ^a   McFarland, J P ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; MAGNETIC FIELDS; MAGNETORESISTANCE; SEMICONDUCTING GALLIUM ARSENIDE; SENSORS; THERMOMETERS; THIN FILMS;

LOW TEMPERATURE THERMOMETRY; RESISTANCE THERMOMETERS;

LOW TEMPERATURE PHENOMENA;

EID: 0032303575     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1022535813324     Document Type: Article

References (6)

1. Scientific Instruments, West Palm Beach, FL USA.
2. Lakeshore Cryotronics, Westerville, OH USA.
3. V.F. Mitin, Yu.A. Tyhorik, and E.F. Venger, Microelectronics Journ. 28, 617 (1997).
4. J.S. Kim, University of Florida, Gainesville, FL USA.
5. AVS-47, RV-Elektronikka OY, Vantaa, Finland.
6. See K. Uhlig, Cryogenics 35, 525 (1995) and references therein. Portions of this work have been reported previously in the 1997 Annual Report of the National High Magnetic Field Laboratory, ed. K. Hedick.