On-chip capacitor measurement for high performance microprocessor

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 1998, Pages 65-68

  Pham, N H ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CAPACITORS; DESIGN;

ON-CHIP CAPACITOR MEASUREMENT;

MICROPROCESSOR CHIPS;

EID: 0032302561     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)