Low-frequency scanning capacitance microscopy

Materials Research Society Symposium - Proceedings

Volumn 500, Issue , 1998, Pages 3-14

  Lanyi, S ^a   Hruskovic, M ^a  

^a INSTITUTE OF CHEMISTRY   (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DIELECTRIC LOSSES; MATHEMATICAL TECHNIQUES; MICROSCOPIC EXAMINATION; PROBES; SCANNING; SIGNAL TO NOISE RATIO;

ELECTROMETRIC INPUT; SCANNING CAPACITANCE MICROSCOPY;

CAPACITANCE MEASUREMENT;

EID: 0032302468     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)