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Volumn 6, Issue 12, 1998, Pages 753-754
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UFM shakes out the details at the nanoscopic scale
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC MICROSCOPES;
ADHESION;
ATOMIC FORCE MICROSCOPY;
CRACKS;
DELAMINATION;
ELASTICITY;
MATERIALS TESTING;
NONDESTRUCTIVE EXAMINATION;
ULTRASONIC PROPAGATION;
ULTRASONIC FORCE MICROSCOPY (UFM);
ULTRASONIC VIBRATION;
ULTRASONIC TESTING;
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EID: 0032302279
PISSN: 09678638
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (14)
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References (3)
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