Exact solution to the minimum size test pattern problem

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 1998, Pages 510-515

  Flores, Paulo F ^a   Neto, Horacio C ^a   Marques Silva, Joao P ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; COMPUTATIONAL COMPLEXITY; CONSTRAINT THEORY; ERROR DETECTION; INTEGER PROGRAMMING; LINEAR PROGRAMMING; OPTIMIZATION;

AUTOMATIC TEST PATTERN GENERATION; PROPOSITIONAL SATISFIABILITY;

COMBINATORIAL CIRCUITS;

EID: 0032302181     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)