Physical modeling of partial discharge patterns

IEEE International Conference on Conduction & Breakdown in Solid Dielectrics

Volumn , Issue , 1998, Pages 114-118

  Patsch, Rainer ^a   Hoof, Martin ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRIC FIELD EFFECTS; ELECTRIC INSULATION; MATHEMATICAL MODELS;

ELECTRICAL TREEING (ETP); ELECTRODE BOUNDED CAVITY (EBC); POINT TO DIELECTRIC GAP (PDG);

PARTIAL DISCHARGES;

EID: 0032301117     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)