Estimation of capacitance of small junction from liquid He temperature measurement

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 1998, Pages 215-216

  Iwasa, Akio ^a   Fukushima, Akio ^a   Sato, Akira ^a   Sakamoto, Yasuhiko ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON TUNNELING; HELIUM; TEMPERATURE MEASUREMENT; THERMAL EXPANSION; VOLTAGE MEASUREMENT;

SINGLE ELECTRON TUNNELING ELEMENTS;

CAPACITANCE MEASUREMENT;

EID: 0032300709     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)