Exploring defect data from development and customer usage on software modules over multiple releases

Proceedings of the International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 1998, Pages 316-320

  Biyani, Shriram ^a   Santhanam, P ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; FAILURE ANALYSIS; STATISTICS;

SOFTWARE MODULES; SOFTWARE PRODUCTS;

SOFTWARE ENGINEERING;

EID: 0032300570     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)