Charge offset and noise in SET transistors

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 1998, Pages 138-139

  Zimmerman, Neil M ^a   Cobb, Jonathan L ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; SPURIOUS SIGNAL NOISE; TUNNEL JUNCTIONS;

SINGLE ELECTRON TUNNELING (SET) TRANSISTORS;

TRANSISTORS;

EID: 0032300186     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)