Sub-pixel accuracy by optical measurement of large automobile components

IECON Proceedings (Industrial Electronics Conference)

Volumn 4, Issue , 1998, Pages 2431-2433

  Stanke, Gerd ^a   Zedler, Lutz ^a   Zorn, Adjo ^a   Weckend, Frank ^a   Weide, Hans Guenter ^a  

^a GFaI Berlin   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABRASIVE CUTTING; ALGORITHMS; AUTOMOBILE PARTS AND EQUIPMENT; CALIBRATION; IMAGE PROCESSING; LASER BEAM EFFECTS; LIGHT MEASUREMENT; NUMERICAL CONTROL SYSTEMS;

SUB-PIXEL ACCURACY;

LASER APPLICATIONS;

EID: 0032299022     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)