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Applied Physics A: Materials Science and Processing

Volumn 67, Issue 6, 1998, Pages 667-673

Free-electron laser for infrared SEW characterization surfaces of conducting and dielectric solids and nm films on them

(7) Zhizhin, G N a Alieva, E V a Kuzik, L A a Yakovlev, V A a Shkrabo, D M a Van Der Meer, A F G b Van Der Wiel, M J c

a INSTITUTE OF SPECTROSCOPY (Russian Federation)

b FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN (Netherlands)

c EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; BANDWIDTH; CONDUCTIVE MATERIALS; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVES; FREE ELECTRON LASERS; INTERFEROMETRY; LASER PULSES; LASER TUNING; NANOSTRUCTURED MATERIALS; SURFACE PROPERTIES; THIN FILMS;

NONLINEAR SPECTROSCOPY; SURFACE ELECTROMAGNETIC WAVES (SEW) SPECTROSCOPY;

INFRARED SPECTROSCOPY;

EID: 0032298873 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390050838 Document Type: Article

Times cited : (14)

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