Analysis of the AXAF HRMA+ACIS effective area measurements from the XRCF

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3444, Issue , 1998, Pages 198-209

  Allen, Christopher L ^a   Plucinsky, Paul P ^a   McNamara, Brian R ^a   Edgar, Richard J ^a   Schulz, Norbert S ^a   Woo, Jonathan W ^a  

^a SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; CALIBRATION; CHARGE COUPLED DEVICES; ENERGY DISPERSIVE SPECTROSCOPY; MATHEMATICAL MODELS; MIRRORS; X RAY SPECTROPHOTOMETERS;

ADVANCED X RAY ASTROPHYSICS FACILITY (AXAF); HIGH RESOLUTION MIRROR ASSEMBLY (HRMA); X RAY CALIBRATION FACILITY (XRCF);

SPACE OPTICS;

EID: 0032298493     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.331237     Document Type: Conference Paper

References (10)