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Volumn 3436, Issue 1, 1998, Pages 112-119
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Investigation of CdTe films deposited by helicon sputtering for p-type Hg0.77Cd0.23Te surface passivation
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL DEFECTS;
CRYSTAL MICROSTRUCTURE;
MERCURY COMPOUNDS;
MIS DEVICES;
MORPHOLOGY;
PASSIVATION;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING CADMIUM COMPOUNDS;
SPUTTER DEPOSITION;
THERMODYNAMIC STABILITY;
TRANSMISSION ELECTRON MICROSCOPY;
HELICON SPUTTERING METHODS;
SEMICONDUCTING FILMS;
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EID: 0032298469
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (3)
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References (5)
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