Penetration depth measurement in high quality YBa2Cu3O7 - X thin films

European Physical Journal B

Volumn 5, Issue 2, 1998, Pages 159-162

  Farber, E ^a   Deutscher, G ^a   Contour, J P ^b   Jerby, E ^a  

^a TEL AVIV UNIVERSITY   (Israel)

^b CNRS   (France)

Author keywords

74.25.Nf Response to electromagnetic fields (nuclear magnetic resonance, surface impedance, etc.); 74.72.Bk Y based cuprates; 74.76.Bz High Tc films

Indexed keywords

DEPOSITION; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; PULSED LASER APPLICATIONS; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; THIN FILMS;

PARALLEL PLATE RESONATOR METHOD; PENETRATION DEPTH MEASUREMENT; PULSED LASER DEPOSITION;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0032298242     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510050429     Document Type: Article

References (25)

1. J. Annett, N. Goldenfeld, S.R. Renn, Phys. Rev. B 43, 2778 (1991).
2. W.N. Hardy, D.A. Bonn, D.C. Morgan, Ruixing Liang, Kuan Zhang, Phys. Rev. Lett. 70, 3999 (1993).
3. J.P. Turneaure, J. Halbritter, H.A. Schwettman, J. Supercond. 5, 341 (1991).
4. D.J. Scalapino, Phys. Rep. 250, 329 (1995).
5. J. Halbraitter, Z. Physik. 238, 466 (1970).
6. D.A. Bonn, Ruixing Liang, T.M. Riseman, D.J. Baar, D.C. Morgan, Kuan Zhang, P. Dosanjh, T.L. Duty, A. Macfarlane, G.D. Morris, J.H. Brewer, W.N. Hardy, C. Kallin, A.J. Berlinsky, Phys. Rev. B 47, 11314 (1993).
7. D.A. Bonn, S. Kamal, Kuan Zhang, Ruixing Liang, D.J. Baar, E. Klein, W.N. Hardy, Phys. Rev. B 50, 4051 (1994).
8. Zhengxiang Ma, R.C. Taber, L.W. Lombardo, A. Kapitulnik, M.R. Beasley, P. Merchant, C.B. Eom, S.Y. Hou, J.M. Phillips, Phys. Rev. Lett. 71, 781 (1993).
9. J.P. Contour, C. Sant, D. Revelosona, B. Fisher, L. Patlagam, Jpn. J. Appl. Phys. 32, L1134 (1993).
10. D.A. Bonn, P. Dosanjh, R. Liang, W.N. Hardy, Phys. Rev. Lett. 68, 2390 (1992).
11. D.A. Bonn, S. Kamal, Kuan Zhang, Ruixing Liang, W.N. Hardy, J. Phys. Chem. Solids 56, 1941 (1995).
12. R.C. Taber, Rev. Sci. Instrum 61, 2200 (1990).
13. R.L. Kautz, J. Appl. Phys. 49, 308 (1978).
14. R.C. Taber, P. Merchant, R. Hiskes, S.A. Dicarolis, M. Narbutovskih, J. Supercond. 5, 371 (1992).
15. M. Lippert, J.P. Strobel, G. Saemann-Ischenko, S. Orbach, S. Hensen, G. Muller, H. Piel, J. Schutzmann, K.F. Renk, B. Roas, W. Gieres, Physica C 185, 1041 (1991).
16. N. Klein, N. Tellmann, H. Schulz, K. Urban, S.A. Wolf, V.Z. Kresin, Phys. Rev. Lett. 71, 3355 (1993).
17. E. Farber, G. Deutscher, G. Koren, E. Jerby, IEEE convention, Israel (1996).
18. D.A. Bonn, S. Kamal, Kuan Zhang, Ruixing Liang, D.J. Baar, E. Klein, W.N. Hardy, Phys. Rev. B. 50, 4051 (1994).
19. P.J. Hirschfeld, W.O. Putikka, D.J. Scalapino, Phys. Rev. B 50, 10250 (1994).
20. N. Klein, N. Tellmann, H. Schulz, K. Urban, S.A. Wolf, V.Z. Kresin, Phys. Rev. Lett. 20, 3355 (1993).
21. E. Roddick, D. Stround, Phys. Rev. Lett. 74, 1430 (1995); M.W. Coffey, Phys. Lett. A 200, 195 (1995); V.J. Emery, S.V. Kivelson, Phys. Rev. Lett. 74, 3253 (1995).
22. E. Roddick, D. Stround, Phys. Rev. Lett. 74, 1430 (1995); M.W. Coffey, Phys. Lett. A 200, 195 (1995); V.J. Emery, S.V. Kivelson, Phys. Rev. Lett. 74, 3253 (1995).
23. E. Roddick, D. Stround, Phys. Rev. Lett. 74, 1430 (1995); M.W. Coffey, Phys. Lett. A 200, 195 (1995); V.J. Emery, S.V. Kivelson, Phys. Rev. Lett. 74, 3253 (1995).
24. D. Racah, G. Deutscher, Physica C 263, 218 (1996).
25. Ch. Renner, B. Revaz, J.-Y. Genoud, O. Fischer, J. Low Temp. Phys 105, 1083 (1996).