1/f noise in ion selective field effect transistors compared to MOSFETs

Proceedings of the Mediterranean Electrotechnical Conference - MELECON

Volumn 2, Issue , 1998, Pages 1456-1460

  Jakobson, C G ^a   Nemirovsky, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; INTERFACES (MATERIALS); ION SENSITIVE FIELD EFFECT TRANSISTORS; MATHEMATICAL MODELS; MOSFET DEVICES; SIGNAL NOISE MEASUREMENT; SOLUTIONS; SPURIOUS SIGNAL NOISE;

DRAIN CURRENT NOISE; GATE VOLTAGE CHANGING; LOW FREQUENCY NOISE;

PH SENSORS;

EID: 0032297828     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)