Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2-12 keV

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3444, Issue , 1998, Pages 140-159

  Graessle, D E ^a   Blake, R L ^a   Burek, A J ^a   Dyson, S E ^a   Fitch, J J ^a   Schwartz, D A ^a   Soufli, R ^a  

^a SMITHSONIAN ASTROPHYSICAL OBSERVATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASTROPHYSICS; ELECTROMAGNETIC WAVE REFLECTION; MIRRORS; OPTICAL COATINGS; SURFACE ROUGHNESS; SYNCHROTRON RADIATION;

ADVANCED X RAY ASTROPHYSICS FACILITY (AXAF); WITNESS MIRRORS;

SPACE OPTICS;

EID: 0032297507     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.331233     Document Type: Conference Paper

References (18)