Efficient test-point selection for scan-based BIST

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 6, Issue 4, 1998, Pages 667-676

  Tsai, Huan Chih ^a,b   Cheng, Kwang Ting ^a,b   Lin, Chih Jen ^a,c   Bhawmik, Sudipta ^a,d  

^a IEEE   (United States)

^b University of California   (United States)

^c INTEL CORPORATION   (United States)

^d LUCENT TECHNOLOGIES   (United States)

Author keywords

Built in self test (BIST); Test point

Indexed keywords

ALGORITHMS; FEEDBACK; SCANNING; TESTING;

TEST POINTS;

BUILT-IN SELF TEST;

EID: 0032297062     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/92.736140     Document Type: Article

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