Single event effects on commercial SRAMs and power MOSFETs: final results of the CRUX flight experiment on APEX

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1998, Pages 1-10

  Barth, J L ^a   Adolphsen, J W ^a   Gee, G B ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SINGLE EVENT EFFECTS;

COSMIC RAYS; PHOTOVOLTAIC EFFECTS; SATELLITES;

MOSFET DEVICES;

EID: 0032295573     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)