Total-dose radiation tolerance of a commercial 0.35 μm CMOS process

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1998, Pages 104-110

  Lacoe, R C ^a   Osborn, J V ^a   Mayer, D C ^a   Brown, S ^a   Hunt, D R ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD-OXIDE TRANSISTORS; RADIATION TOLERANCE;

CMOS INTEGRATED CIRCUITS; DOSIMETRY; TESTING; TRANSISTORS;

RADIATION EFFECTS;

EID: 0032295231     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)