Imaging of a Suspended Helium Film with 2-D Electrons by Interferometry

Journal of Low Temperature Physics

Volumn 113, Issue 5-6, 1998, Pages 1115-1120

  Valkering, A M C ^b   Klier, J ^a   Teske, E ^a   Van Der Heijden, R W ^b   Leiderer, P ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON GAS; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC STRUCTURE; IMAGING TECHNIQUES; INTERFEROMETRY; PROBES; SIGNAL NOISE MEASUREMENT;

SUSPENDED HELIUM FILM; TWO DIMENSIONAL ELECTRON;

HELIUM;

EID: 0032295103     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1022537308297     Document Type: Article

References (11)

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