Double barrier spin dependent tunnel junctions with an intermediate ferromagnetic layer

Materials Research Society Symposium - Proceedings

Volumn 517, Issue , 1998, Pages 97-102

  Sousa, R C ^a   Freitas, P P ^a   Galvao, T T ^a   Sun, J J ^a   Soares, V ^a   Kling, A ^a   da Silva, M F ^a   Soares, J C ^a  

^a INESC   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ELECTRIC CONDUCTANCE; ELECTRIC INSULATORS; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; MAGNETIC FILMS; MAGNETIC VARIABLES MEASUREMENT; MAGNETORESISTANCE; OXIDATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR DEVICE STRUCTURES;

FERROMAGNETIC LAYER; INSULATOR BARRIER; PLASMA OXIDATION;

TUNNEL JUNCTIONS;

EID: 0032294960     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)