Model reduction for PEEC models including retardation

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 1998, Pages 287-290

  Cullum, J ^a   Ruehli, A E ^a   Zhang, T ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONNECTORS; ELECTRIC LOSSES; EQUIVALENT CIRCUITS; THREE DIMENSIONAL;

RETARDATION;

ELECTRONICS PACKAGING;

EID: 0032293671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)