Evidence for crystallographically abrupt grain boundaries in nanocrystalline copper

EPJ Applied Physics

Volumn 4, Issue 2, 1998, Pages 161-164

  Champion, Y ^a   Hytch M J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL IMPURITIES; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

REFLECTION ELECTRON MICROSCOPY;

COPPER;

EID: 0032292860     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:1998256     Document Type: Article

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