Characterization of near- and far-field radiation from ultrafast electronic systems

IEEE Transactions on Microwave Theory and Techniques

Volumn 46, Issue 12 PART 2, 1998, Pages 2476-2483

  Remley, Kate A ^a   Weisshaar, Andreas ^b   Goodnick, Stephen M ^a   Tripathi, Vijai K ^b  

^a 1148 Kelley Engineering Center Corvallis   (United States)

^b AZ 85281   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; FINITE DIFFERENCE METHOD; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; MILLIMETER WAVE DEVICES; PHOTOCONDUCTING DEVICES; TIME DOMAIN ANALYSIS; ULTRAFAST PHENOMENA;

KIRCHOFF SURFACE INTEGRAL; ULTRAFAST ELECTRONICS;

ELECTROMAGNETIC FIELDS;

EID: 0032292172     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.739237     Document Type: Article

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