Testing embedded memories: Is BIST the ultimate solution?

Proceedings of the Asian Test Symposium

Volumn , Issue , 1998, Pages 516-517

  Wu, Cheng Wen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED MEMORY TESTING; QUIESCENT POWER SUPPLY CURRENTS (IDDQ);

BUILT-IN SELF TEST; ELECTRIC CURRENTS; EMBEDDED SYSTEMS; REDUNDANCY; SEMICONDUCTOR DEVICE TESTING;

DATA STORAGE EQUIPMENT;

EID: 0032291990     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.1998.741668     Document Type: Conference Paper

References (0)