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Volumn 37, Issue 12, 1998, Pages 6446-6450

Degradation of photoluminescence and electron paramagnetic defects in naturally oxidized or oxygen-implanted porous silicon with electron spin resonance imaging

Author keywords

Anodizing; Dangling bond; Electron paramagnetic resonance; Electron spin resonance; EPR; Imaging; Ion implantation; Oxygen; Pb center; Porous silicon

Indexed keywords

ANODIC OXIDATION; CHARGE COUPLED DEVICES; CHEMICAL BONDS; COMPOSITION EFFECTS; CRYSTAL DEFECTS; DENSITY (OPTICAL); ELECTRON SPIN RESONANCE SPECTROSCOPY; ION IMPLANTATION; OXYGEN; PARAMAGNETIC RESONANCE; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY;

EID: 0032291365     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.6446     Document Type: Article
Times cited : (5)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.