Multi-channel analyzer/detector system for high-speed, high-resolution powder diffraction

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3448, Issue , 1998, Pages 120-131

  Siddons, D P ^a   Yin, Zhijian ^a   Furenlid, L ^a   Pietraski, P ^a   Li, Zheng ^a   Harlow, R ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION DETECTORS; SEMICONDUCTING SILICON;

MULTIDETECTOR TECHNOLOGY; POWDER DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHY;

EID: 0032291168     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)