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Volumn 8, Issue 4, 1998, Pages 164-167

Improvement of accuracy in measurements of the surface resistance of superconductors using dielectric resonators

Author keywords

Dielectric resonators; Rutile dielectric resonator; Surface resistance measurements

Indexed keywords

ASPECT RATIO; CRYSTAL RESONATORS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; ELECTRIC RESISTANCE MEASUREMENT; NATURAL FREQUENCIES; Q FACTOR MEASUREMENT; SAPPHIRE;

EID: 0032290664     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.740681     Document Type: Article
Times cited : (11)

References (12)
  • 4
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    • A sapphire resonator for microwave characterization of superconducting thin films
    • C. Wilker, Z.-Y. Shen, V. Nguyen, and M. Brenner, "A sapphire resonator for microwave characterization of superconducting thin films," IEEE Trans. Appl. Superconduct., vol. 3, pp. 1457-1460, 1993.
    • (1993) IEEE Trans. Appl. Superconduct. , vol.3 , pp. 1457-1460
    • Wilker, C.1    Shen, Z.-Y.2    Nguyen, V.3    Brenner, M.4
  • 6
    • 0030193428 scopus 로고    scopus 로고
    • Properties and applications of HTS-shield dielectric resonators: A state-of-the-art report
    • July
    • N. Klein et al., "Properties and applications of HTS-shield dielectric resonators: A state-of-the-art report," IEEE Trans. Microwave Theory Tech., vol. 44, pp. 1369-1373, July 1996.
    • (1996) IEEE Trans. Microwave Theory Tech. , vol.44 , pp. 1369-1373
    • Klein, N.1
  • 7
    • 33748169928 scopus 로고    scopus 로고
    • Whispering gallery modes for complex permittivity measurements of ultra-low loss dielectric materials
    • J. Krupka et al., "Whispering gallery modes for complex permittivity measurements of ultra-low loss dielectric materials," IEEE Microwave Theory Tech. Dig., pp. 1347-1350.
    • IEEE Microwave Theory Tech. Dig. , pp. 1347-1350
    • Krupka, J.1
  • 9
    • 0022100780 scopus 로고
    • Microwave measurement of dielectric properties of low-loss materials by the dielectric rod resonator method
    • July
    • Y. Kobayashi and M. Katoh, "Microwave measurement of dielectric properties of low-loss materials by the dielectric rod resonator method," IEEE Trans. Microwave Theory Tech., vol. 33, pp. 586-592, July 1985.
    • (1985) IEEE Trans. Microwave Theory Tech. , vol.33 , pp. 586-592
    • Kobayashi, Y.1    Katoh, M.2
  • 10
  • 12
    • 0029353050 scopus 로고
    • Influence of films thickness and air gaps in the surface impedance measurements of high temperature superconductors using the dielectric resonator technique
    • J. Ceremuga, J. Krupka, R. Geyer, and J. Modelski, "Influence of films thickness and air gaps in the surface impedance measurements of high temperature superconductors using the dielectric resonator technique," IECE Trans. Electron., vol. E 78-C, no. 8, pp. 1106-1110, 1995.
    • (1995) IECE Trans. Electron. , vol.E 78-C , Issue.8 , pp. 1106-1110
    • Ceremuga, J.1    Krupka, J.2    Geyer, R.3    Modelski, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.