A comparison of measurement and defect characteristics of new and legacy software systems

Journal of Systems and Software

Volumn 44, Issue 2, 1998, Pages 135-146

  Tian, Jeff ^a   Troster, Joel ^b  

^a Southern Methodist University   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

Defect; Large software systems; Software metrics; Statistical analysis; Tree based modeling

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER SOFTWARE; SOFTWARE ENGINEERING; STATISTICAL METHODS;

LEGACY SOFTWARE SYSTEMS; SOFTWARE METRICS; TREE BASED MODELING;

LEGACY SYSTEMS;

EID: 0032290386     PISSN: 01641212     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0164-1212(98)10050-X     Document Type: Article

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