Radiation damage of silicon strip detectors in the NA50 experiment

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 419, Issue 2-3, 1998, Pages 556-569

  Alessandro, B ^a   Beole S ^a   Bonazzola, G ^a   Crescio, E ^a   Dabrowski W ^b   Giubellino, P ^a   Grybos, P ^b   Idzik, M ^b   Martinetto, M ^a   Marzari Chiesa, A ^a   Masera, M ^a   Prino, F ^a   Ramello, L ^a   Mendes, P R ^a   Riccati, L ^a   Sitta, M ^a  

^a SEZIONE DI TORINO   (Italy)

^b AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

Noisy channels; Radiation damage; Silicon strip detectors

Indexed keywords

CHARGED PARTICLES; RADIATION DAMAGE; SEMICONDUCTING SILICON;

MULTIPLICITY DETECTORS; SILICON STRIP DETECTORS;

SEMICONDUCTOR COUNTERS;

EID: 0032290017     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)00868-7     Document Type: Article

References (7)

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6. W. Dabrowski, K. Korbel, Nucl. Instr. Meth. A 276 (1989) 270.
7. L.J. Beattie et al., ATLAS Internal Note INDET-NO-194, 9 December 1997.