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Volumn 3512, Issue , 1998, Pages 367-373
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Novel technique to measure the thermal conductivity of thin film membranes
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTING SILICON COMPOUNDS;
THERMAL CONDUCTIVITY OF SOLIDS;
THERMOCOUPLES;
THIN FILMS;
POLYSILICON RESISTORS;
THIN FILM MEMBRANES;
MICROELECTROMECHANICAL DEVICES;
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EID: 0032289749
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.324081 Document Type: Conference Paper |
Times cited : (1)
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References (15)
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