Thermal study of Ga2Te3 chalcogenide

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3316, Issue 2, 1998, Pages 1267-1270

  Singh, D P ^a   Upreti, U C ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL THERMAL ANALYSIS; THERMAL EFFECTS; THERMOCOUPLES; X RAY DIFFRACTION ANALYSIS;

PERKIN-ELMER THERMAL ANALYZER;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0032289712     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)