Methodology and design for effective testing of voltage-controlled oscillators (VCOs)

Proceedings of the Asian Test Symposium

Volumn , Issue , 1998, Pages 383-387

  Azais, F ^a   Ivanov, A ^a   Renovell, M ^a   Bertrand, Y ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL TESTER; RING OSCILLATORS;

COMPUTER SIMULATION; DESIGN FOR TESTABILITY; DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING;

VARIABLE FREQUENCY OSCILLATORS;

EID: 0032289701     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. M. Toner and G. Robert, "Histogram-based Test for Distortion and Gain Tracking", Workshop on New Direction for Testing, pp. 97-112, 1992
2. K.D. Wagner and T.W. Williams, "Design For Testability of Mixed Signal Integrated Circuits", Int'l Test Conf., pp. 823-829, 1988
3. P. Fasang et al, "Design for Testability for Mixed Signal Analog Digital ASICs", Custom Int. Circuits Conf., pp. 16.5.1-4, 1988
4. C.L. Wey, "Built-in Self-Test (BIST) Structure for Analog Circuit Fault Diagnosis", IEEE Trans, on Instrum. and Measurements, Vol. 39, No. 3, pp. 517-521, June 1990
5. M. Soma, "A Design-for-Test Methodology for Active Analog Filters", Int'l Test Conf., pp. 183-192, 1990
6. J.L. Huertas, A. Rueda and D. Vazquez, "Testable Switched-Capacitor Filters", IEEE Journal of Solid State Circuits, Vol. 28, No. 7, pp. 719-724, July 1993
7. M. Renovell, F. Azai's and Y. Bertrand, "A Design-for-Test Technique for Multi-Stage Analog Circuits", Asian Test Symp., pp. 113-119, 1995
8. D. Vazquez, A. Rueda and J.L. Huertas, "A New Strategy for Testing Analog Filters", VLSI Test Symp., pp. 36-41, 1994
9. M. Renovell, F. Azai's and Y. Bertrand, "The Multi-Configuration: A FT Technique for Analog Circuits", VLSI Test Symp., pp. 54-59, 1996.
10. K. Arabi and B. Kaminska, "Oscillation-Test Strategy for Analog and Mixed-Signal Integrated Circuits ", VLSI Test Symp., pp. 476-482, 1996.
11. M.J. Ohletz, "Hybrid Built-in Self-Test (HBIST) for Mixed Analog/Digital Integrated Circuits", European Test Conf., pp. 307-316, 1991