Evaluation of high performance converters under low dose rate total ionizing dose (TID) testing for NASA programs

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1998, Pages 142-147

  Sharma, A K ^a   Sahu, K ^a   Kniffin, S ^a  

^a NASA HEADQUARTERS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BIPOLAR SEMICONDUCTOR DEVICES; CMOS INTEGRATED CIRCUITS; DIGITAL TO ANALOG CONVERSION; TESTING;

HIGH PERFORMANCE CONVERTERS; TOTAL IONIZING DOSE;

RADIATION EFFECTS;

EID: 0032289338     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)