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Volumn 419, Issue 2-3, 1998, Pages 549-555
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Layout and tests of silicon pad detectors for the PHOBOS experiment at RHIC
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Author keywords
Double metal; Pad detector; Readout scheme; Silicon
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Indexed keywords
HEAVY IONS;
PARTICLE BEAM DYNAMICS;
PARTICLE BEAM TRACKING;
SEMICONDUCTING SILICON;
VLSI CIRCUITS;
ION COLLISIONS;
LOW-MOMENTUM TRACKS RECONSTRUCTION;
PARTICLE MULTIPLICITY;
SILICON PAD DETECTORS;
SEMICONDUCTOR COUNTERS;
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EID: 0032289337
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(98)00833-X Document Type: Article |
Times cited : (22)
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References (3)
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